HIOKI 임피던스 아날라이져 IM7580

HIOKI 임피던스 아날라이져 IM7580

(빠른 측정, 높은 반복 정밀도로 생산성 향상)

 

 

 

 

 

 

IM7580E2-5ZE.pdf

 

 

 

> 측정 주파수 1MHz~300MHz
> 측정 시간 : 빠른 0.5ms
> 기본 정확도 ± 0.72 % rdg.
> 하프랙 사이즈의 컴팩트한 본체
> 광범위한 접촉 체크(via DCR testing, Hi-Z reject or waveform judgment)
> 아날라이저 모드에서 측정주파수, 측정신호 레벨을 sweep하며 측정.

 

기본 스펙

Measurement modes	LCR mode, Analyzer mode (Sweeps with measurement frequency and measurement level), Continuous measurement mode
Measurement parameters	Z, Y, θ, Rs (ESR), Rp, X, G, B, Cs, Cp, Ls, Lp, D (tanδ), Q
Measurable range	100 mΩ to 5 kΩ
Display range	Z: 0.00 m to 9.99999 GΩ / Rs, Rp, X: ± (0.00 m to 9.99999 GΩ) Ls, Lp: ± (0.00000 n to 9.99999 GH) / Q: ± (0.00 to 9999.99) θ: ± (0.000° to 999.999°), Cs, Cp: ± (0.00000 p to 9.99999 GF) D: ± (0.00000 to 9.99999), Y: (0.000 n to 9.99999 GS) G, B: ± (0.000 n to 9.99999 GS), Δ%: ± (0.000 % to 999.999 %)
Basic accuracy	Z: ±0.72 % rdg. θ: ±0.41°
Measurement frequency	1 MHz to 300 MHz (100 Hz to 10 kHz steps)
Measurement signal level	Power: -40.0 dBm to +7.0 dBm Voltage: 4 mV to 1001 mV rms Current: 0.09 mA to 20.02 mA
Output impedance	50 Ω (at 10 MHz)
Display	8.4-inch color TFT with touch screen
Measurement speeds	FAST: 0.5 ms (Analog measurement time, typical value)
Functions	Contact check, Comparator, BIN measurement (classification), Panel loading/saving, Memory function, Equivalent circuit analysis, Correlation compensation
Interfaces	EXT I/O (Handler), USB communication, USB memory, LAN, RS-232C (optional), GP-IB (optional)
Power supply	100 to 240 V AC, 50/60 Hz, 70 VA max.
Dimensions and mass	Main unit: 215 mm (8.46 in) W × 200 mm (7.87 in) H × 268 mm (10.55 in) D, 6.5 kg (229.3 oz) Test head: 61 mm (2.40 in) W × 55 mm (2.17 in) H × 24 mm (0.94 in) D, 175 g (6.2 oz)
Accessories	Test head ×1, Connection cable ×1, Instruction manual ×1, LCR application disc (Communications user manual) ×1, Power cord ×1